BME Seminar: IoT Device Security in a Zero Trust Environment

The mission of the Cybersecurity Assurance and Policy (CAP) Center at Morgan State University is to provide the defense and intelligence community with the knowledge, methodology, solutions, and highly skilled cybersecurity professionals to mitigate penetration and manipulation of our nation’s cyber-physical infrastructure. Internet of Things (IoT) devices permeate all areas of life and work, with unprecedented economic effects. Critical infrastructures in transportation, the smart grid, manufacturing, health care, and many others depend on embedded systems for distributed control, tracking, and data collection. While protecting these systems from hacking, intrusion, and physical tampering is paramount, current solutions rely on unsustainable patchwork solutions. Transformative solutions are required to protect systems where the ubiquity of connectivity and heterogeneity of IoT devices exacerbate the attack surface. Our research focuses on the convergence of IoT, 5G, and artificial intelligence in the context of the Zero Trust networks. We will talk about our research and workforce development.

Kevin T. Kornegay (kevin [dot] kornegaymorgan [dot] edu (kevin[dot]kornegay[at]morgan[dot]edu)) received a B.S. degree in electrical engineering from Pratt Institute, Brooklyn, NY, in 1985 and an M.S. and Ph.D. degree in electrical engineering from the University of California at Berkeley in 1990 and 1992, respectively. He is currently the Eugene DeLoatch Endowed Professor in Cybersecurity and Director of the Cybersecurity Assurance & Policy (CAP) Center at Morgan State University in Baltimore, MD. His research interests include hardware and software assurance, reverse engineering, secure embedded systems, side-­‐channel analysis, and fault injection. Dr. Kornegay serves or has served on the technical program committees of several international conferences, including the IEEE Symposium on Hardware Oriented Security and Trust (HOST), USENIX Security, the IEEE Physical Assurance and Inspection of Electronics (PAINE), and the ACM Great Lakes Symposium on VLSI (GLSVLSI). He is the recipient of multiple awards, including the NSF CAREER Award, IBM Faculty Partnership Award, National Semiconductor Faculty Development Award, and the General Motors Faculty Fellowship Award. He is currently a senior member of the IEEE, Eta Kappa Nu, Sigma Xi, and Tau Beta Pi engineering honor societies.